YOHANES, B. W. Images Similarity based on Bags of SIFT Descriptor and K-Means Clustering. Techné : Jurnal Ilmiah Elektroteknika, [S. l.], v. 18, n. 2, p. 137–146, 2019. DOI: 10.31358/techne.v18i02.217. Disponível em: https://ojs.jurnaltechne.org/index.php/techne/article/view/217. Acesso em: 14 nov. 2024.